5 article(s) from Fantner, Georg E
Enhanced feedback performance in off-resonance AFM modes through pulse train sampling
- Mustafa Kangül,
- Navid Asmari,
- Santiago H. Andany,
- Marcos Penedo and
- Georg E. Fantner
Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13
An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
- Santiago H. Andany,
- Gregor Hlawacek,
- Stefan Hummel,
- Charlène Brillard,
- Mustafa Kangül and
- Georg E. Fantner
Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111
Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process
- Nahid Hosseini,
- Matthias Neuenschwander,
- Oliver Peric,
- Santiago H. Andany,
- Jonathan D. Adams and
- Georg E. Fantner
Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226
High-frequency multimodal atomic force microscopy
- Adrian P. Nievergelt,
- Jonathan D. Adams,
- Pascal D. Odermatt and
- Georg E. Fantner
Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255
Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing
- Blake W. Erickson,
- Séverine Coquoz,
- Jonathan D. Adams,
- Daniel J. Burns and
- Georg E. Fantner
Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84
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